This inventor holds 1 USPTO granted patent. Top assignee: Sysmex Corporation. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Naoya Maeda and His Sample Analyzer Patent
Introduction
Naoya Maeda is an inventor associated with Kanzaki, Japan, and Sysmex Corporation. His patent work includes an invention designed to help sample analyzers accurately determine how many samples can be analyzed with the available reagents.
Latest Patents
The provided information lists one patent for Maeda: “Sample analyzer.” The invention calculates the number of analyzable samples using the reagent’s remaining tests and the tests needed for control measurements. When creating a calibration curve, it also accounts for the reagent tests required for calibrator measurements. The analyzer then displays the calculated number, helping users understand how many samples can be processed.
Career Highlights
Maeda’s listed patent reflects work on practical improvements to sample analysis and reagent management. The information provided associates him with Sysmex Corporation, a company focused on diagnostic technologies. His listed portfolio includes 1 patent.
Collaborations
The provided information names Tsukasa Hirata and Shoichiro Asada as Maeda’s coworkers. It does not specify their roles in the patent or describe particular collaborative projects.
Conclusion
Naoya Maeda’s listed invention addresses a useful laboratory need by helping users estimate analyzable sample capacity from reagent availability and measurement requirements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile