Location History:
- Kanagawa, JP (1981)
- Tsukuba, JP (1991)
Company Filing History:
Years Active: 1981-1991
Title: Naotake Ooyama: Innovator in Optical Measurement Technologies
Introduction
Naotake Ooyama is a distinguished inventor based in Tsukuba, Japan. He has made significant contributions to the field of optical measurement technologies, holding a total of 3 patents. His work focuses on developing advanced devices for measuring small changes in refractive indices, which are crucial for various scientific applications.
Latest Patents
One of Ooyama's latest patents is a high stability interferometer designed for measuring small changes in refractive index. This innovative device allows for continuous measurement by utilizing a diffraction grating that can be moved sideways or radially. The interferometer diffracts laser light into multiple beams, including +1, -1, and zero order beams, which are then focused and reflected back towards the lens for precise measurement.
Another notable patent is related to a method and device for achieving optical spatial phase modulation. This technology involves positioning a liquid crystal layer in the path of a light beam and controlling the spatial distribution of its refractive index through an electrical field. This advancement enhances the modulation capabilities of light beams, making it valuable for various optical applications.
Career Highlights
Ooyama has worked with prominent organizations such as the Agency of Industrial Science and Technology and the Ministry of International Trade and Industry. His experience in these institutions has allowed him to contribute to significant advancements in optical technologies.
Collaborations
Throughout his career, Ooyama has collaborated with notable individuals, including Thomas H. Barnes and Kiyofumi Matsuda. These partnerships have fostered innovation and development in the field of optical measurement.
Conclusion
Naotake Ooyama's contributions to optical measurement technologies have established him as a key figure in the field. His innovative patents and collaborations reflect his commitment to advancing scientific understanding through precise measurement techniques.
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