Company Filing History:
Years Active: 2019
Title: Naotaka Suganuma: Innovator in Eddy-Current Flaw Detection
Introduction
Naotaka Suganuma, an esteemed inventor based in Yokohama, Japan, has made significant contributions in the field of flaw detection technology. He holds one patent that showcases his innovative approach to eddy-current flaw detection, a crucial technique used in various industries for identifying surface imperfections.
Latest Patents
Suganuma's notable patent is titled "Eddy-current flaw detector and eddy-current flaw detection method." This invention includes a trace data calculator designed to calculate coordinates for flaw detection points, utilizing an inspection probe during eddy-current testing. The technology also incorporates a gap evaluation calculator to assess the space between the inspection surface and probe, alongside a flaw detection data collector to gather defect data for accurate analysis.
Career Highlights
Naotaka Suganuma is currently employed at Kabushiki Kaisha Toshiba, where his expertise in flaw detection technologies has been instrumental in advancing the company's capabilities in quality assurance and material inspection. His patent reflects a blend of technical knowledge and innovative thinking, aimed at improving inspection methodologies.
Collaborations
Throughout his career, Suganuma has collaborated with fellow engineers and inventors, including Noriyasu Kobayashi and Souichi Ueno. These partnerships have fostered an environment of creativity and progress, enabling the development of cutting-edge solutions in eddy-current flaw detection.
Conclusion
Naotaka Suganuma's contributions to the field of eddy-current flaw detection underscore the importance of innovation in enhancing inspection methodologies. His dedication to improving technology through his patent reflects the ongoing evolution within the engineering domain, making significant strides in quality assurance processes.