The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Nov. 10, 2015
Kabushiki Kaisha Toshiba, Minato-Ku, JP;
Noriyasu Kobayashi, Yokohama, JP;
Souichi Ueno, Ota, JP;
Naotaka Suganuma, Yokohama, JP;
Tatsuya Oodake, Zushi, JP;
Takeshi Maehara, Yokohama, JP;
Takashi Kasuya, Yokohama, JP;
Hiroya Ichikawa, Yokohama, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-Ku, JP;
Abstract
An eddy-current flaw detector includes a trace data calculator configured to calculate each coordinate with respect to flaw detection points on which an inspection probe is used upon performing an eddy-current testing based on an inputted condition of eddy-current flaw detection and surface shape data of an inspection-object surface measured by a profilometer, and to calculate a normal vector of each flaw detection point; a gap evaluation calculator configured to acquire an evaluation result on a gap between the inspection-object surface and the inspection probe for each flaw detection point; a flaw detection data collector configured to acquire flaw detection data of an inspection object for each flaw detection point; a flaw detection data analyzer configured to evaluate presence/absence of a flaw in the inspection-object surface based on the flaw detection data of the inspection object and the evaluation result on the gap for each flaw detection point.