Tokyo, Japan

Naota Konda

This inventor holds 1 USPTO granted patent. Top assignee: Nikon Corporation. Active years: 2009.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Naota Konda: Innovator in Focus Detection Technology

Introduction

Naota Konda is a prominent inventor based in Tokyo, Japan. He is known for his contributions to optical technology, particularly in focus detection methods. His innovative approach has led to advancements in the field, making significant impacts on imaging systems.

Latest Patents

Konda holds a patent for the "Best focus detection method, exposure method, and exposure apparatus." This invention involves conforming an aerial image of a measurement mark to a center in the X-axis direction of a slit on a Z tilt stage. By illuminating the measurement mark with light and continuously moving a slit plate in the Z-axis direction, Konda's method allows for the detection of the best focus position in a short period of time. This technology enhances the efficiency and accuracy of projection optical systems.

Career Highlights

Naota Konda has made significant strides in his career, particularly through his work at Nikon Corporation. His expertise in optical systems has positioned him as a key figure in the development of advanced imaging technologies. Konda's innovative spirit and dedication to research have earned him recognition in the field.

Collaborations

Konda has collaborated with Tsuneyuki Hagiwara, further enhancing the innovative capabilities within their projects. Their partnership has contributed to the development of cutting-edge technologies in optical measurement.

Conclusion

Naota Konda's work in focus detection technology exemplifies the spirit of innovation in the optical field. His contributions continue to influence advancements in imaging systems, showcasing the importance of research and development in technology.

Profile summary based on public USPTO records.
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