Hirakata, Japan

Naomi Kainou

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naomi Kainou. Retrieved from https://idiyas.com/inventor/naomi-kainou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Naomi Kainou: Innovator in Flip Chip Technology

Introduction

Naomi Kainou is a prominent inventor based in Hirakata, Japan. She has made significant contributions to the field of electronics, particularly in the area of flip chip technology. Her innovative work has led to the development of a specialized apparatus that enhances manufacturing processes.

Latest Patents

Naomi holds a patent for an "IC discarding apparatus for flip chip mounting facility." This invention is crucial for improving efficiency and reliability in the production of electronic components. It showcases her ability to address complex challenges in the industry.

Career Highlights

Naomi Kainou is associated with Matsushita Electric Industrial Co., Ltd., a leading company in the electronics sector. Her role at the company has allowed her to work on cutting-edge technologies and contribute to advancements in electronic manufacturing.

Collaborations

Throughout her career, Naomi has collaborated with notable colleagues, including Hiroyuki Kiyomura and Kenji Takahashi. These partnerships have fostered innovation and have been instrumental in the successful development of her projects.

Conclusion

Naomi Kainou is a trailblazer in the field of electronics, with her patent and collaborative efforts marking her as a key figure in the industry. Her work continues to influence the future of electronic manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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