Tokyo, Japan

Naoko Asano

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoko Asano. Retrieved from https://idiyas.com/inventor/naoko-asano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Naoko Asano: Innovator in Image Processing Technology

Introduction

Naoko Asano is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of image processing, showcasing his innovative spirit through his patented technologies. His work focuses on enhancing the recognition of objects within captured images, which has applications in various industries.

Latest Patents

Naoko Asano holds a patent for an "Image processing device, image processing method, and program." This invention involves recognizing the area class to which each pixel in a captured image belongs. It identifies unrecognized-class areas as candidates for areas of interest, determining whether these candidates meet prescribed desired criteria. This technology has the potential to improve image analysis and processing significantly.

Career Highlights

Asano is associated with NEC Corporation, a leading technology company known for its advancements in information technology and communications. His role at NEC has allowed him to work on cutting-edge projects that push the boundaries of image processing technology.

Collaborations

Naoko Asano collaborates with talented individuals such as Yoshihiro Mishima and Erina Kitahara. Their combined expertise fosters an environment of innovation and creativity, leading to the development of groundbreaking technologies.

Conclusion

Naoko Asano's contributions to image processing technology exemplify the impact of innovative thinking in the tech industry. His patent and collaborative efforts continue to influence advancements in this vital field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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