This inventor holds 25 USPTO granted patents and 1 published patent application, primarily in Image Processing Technology. Top assignees: Minolta Camera Kabushiki Kaisha, Minolta Company, Ltd.. Active years: 1986-2001.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Toyoshi. Retrieved from https://idiyas.com/inventor/naoki-toyoshi
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
USPTO Granted Patents = 25 (Patent Applications = 1)
% Patents Active = 100.0
Average Co-Inventor Count = 3.4
ph-index = 8
Forward Citations = 210(Granted Patents)
Location History:
- Aichi, JP (1988 - 1989)
- Toyokawa, JP (1989)
- Osaka, JP (1989 - 1991)
- Toyohashi, JP (1986 - 2001)
Company Filing History:
Years Active: 1986-2001
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Areas of Expertise:
Image Processing
Electrophotographic Devices
Developing Methods
Image Editing Techniques
Image Quality Control
Toner Replenishment
Developing Apparatus
Outline Image Formation
Image Highlighting
Copier Machines
Developer Conveying
Variable Developing Bias
25 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent pending:
IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Toyoshi. Retrieved from https://idiyas.com/inventor/naoki-toyoshi
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
