This inventor holds 1 USPTO granted patent. Top assignee: Nippon Steel Semiconductor Corporation. Active years: 1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1994
Title: Naoki Oka - Innovator in Polysilicon Etching Technology
Introduction
Naoki Oka is a prominent inventor based in Tateyama, Japan. He is known for his significant contributions to the field of semiconductor technology, particularly in polysilicon etching methods. His innovative approaches have paved the way for advancements in the manufacturing processes of semiconductor devices.
Latest Patents
Naoki Oka holds a patent for a polysilicon etching method. This method utilizes an electronic cyclotron resonance etching technique or a microwave plasma etching technique. The process involves two main stages. In the first stage, a mixed gas containing Cl₂ and HBr is used, with Cl₂ occupying 50-70 vol. % of the total gas mixture. The second stage employs a mixed gas of HBr and He, with HBr comprising 20-50 vol. % of the mixture. A low bias voltage ranging from -100 to -30 volts is applied to the specimen carrier during this stage. The invention ensures that polysilicon films can be etched with high dimensional accuracy and without causing undercut.
Career Highlights
Naoki Oka is associated with Nippon Steel Semiconductor Corporation, where he has made significant contributions to the field of semiconductor manufacturing. His work has been instrumental in enhancing the efficiency and precision of etching processes used in the industry.
Collaborations
Naoki Oka has collaborated with notable colleagues, including Hisashi Goda and Yasutoshi Asahina. Their combined expertise has contributed to the development of innovative technologies in semiconductor processing.
Conclusion
Naoki Oka's contributions to polysilicon etching technology exemplify the importance of innovation in the semiconductor industry. His patented methods have improved the accuracy and efficiency of etching processes, making a lasting impact on the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile