Hokkaido, Japan

Naoki Ogawa

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Kurashiki Boseki Kabushiki Kaisha. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Ogawa. Retrieved from https://idiyas.com/inventor/naoki-ogawa-94zxxwe2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Naoki Ogawa: Innovator in HPV Detection

Introduction

Naoki Ogawa is a prominent inventor based in Hokkaido, Japan. He has made significant contributions to the field of medical diagnostics, particularly in the detection of human papillomavirus (HPV). His innovative work has the potential to enhance the accuracy and efficiency of HPV testing.

Latest Patents

Naoki Ogawa holds a patent for a "Primer set and probe for detection of human papillomavirus." This invention is directed towards the detection of multiple types of HPV with high specificity and high sensitivity. The patent provides primer sets, probes, and a kit containing the primer set and the probe for type-specific HPV detection. He has 1 patent to his name.

Career Highlights

Ogawa is associated with Kurashiki Boseki Kabushiki Kaisha, where he continues to work on innovative solutions in the field of medical diagnostics. His expertise and dedication to research have positioned him as a valuable asset in his company.

Collaborations

Naoki Ogawa has collaborated with notable colleagues, including Akiko Kawakami and Isao Miyagawa. Their combined efforts contribute to advancements in HPV detection and other medical technologies.

Conclusion

Naoki Ogawa's work in the detection of human papillomavirus exemplifies the impact of innovation in medical diagnostics. His contributions are vital for improving health outcomes and advancing scientific research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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