Yokohama, Japan

Naoki Go


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 48(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Naoki Go in Quality Control Systems

Introduction

Naoki Go, an esteemed inventor based in Yokohama, Japan, has made significant strides in the field of quality control systems, particularly within the manufacturing of electronic components. With one patent to his name, Go has devised a method that optimizes inspection processes, thereby enhancing economic efficiency in production.

Latest Patents

Naoki Go's patent is titled "System for Quality Control," which presents a revolutionary approach to inspecting electronic components. The system features an inspection apparatus group connected to a network, allowing for the transfer of inspection results to a data collection system. In his invention, the same wafer from a specific process is inspected using different apparatuses. The collected inspected data is then analyzed to calculate a correlation degree among these inspection apparatuses. Furthermore, the invention analyzes failure occurrences during the same process to determine the average failure frequency. By utilizing these calculations, the optimum inspection apparatus and frequency can be determined, guiding the wafer feeding method to the inspection apparatus group through an advanced management system. This innovation streamlines the complexity of setting inspection conditions, ultimately minimizing total loss value and improving economic efficiency in electronic component manufacturing.

Career Highlights

Throughout his career, Naoki Go has demonstrated profound expertise, particularly during his time at Hitachi, Ltd. and Hitachi Electronics Engineering Co., Ltd. His work at these companies has been instrumental in pushing the boundaries of electronic manufacturing technologies and quality control systems.

Collaborations

Naoki Go has collaborated with notable professionals in the field, including Masataka Shiba and Kenji Watanabe. These collaborations have fostered an environment of innovation, allowing for the exchange of ideas and advancements in the quality control sector.

Conclusion

Naoki Go stands out as a significant figure in the world of innovations related to quality control systems. His patent not only addresses the complexities of inspection in electronic component manufacturing but also sets a benchmark for future advancements. Through his work and collaborations, Go contributes to the evolution of manufacturing technologies, making strides toward more efficient production processes.

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