Tachikawa, Japan

Nao Hasegawa

This inventor holds 2 USPTO granted patents. Top assignee: Olympus Imaging Corporation. Active years: 2008-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nao Hasegawa. Retrieved from https://idiyas.com/inventor/nao-hasegawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 54(Granted Patents)


Company Filing History:


Years Active: 2008-2009

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2 patents (USPTO):Explore Patents

Title: Nao Hasegawa: Innovator in Display Technology

Introduction

Nao Hasegawa is a prominent inventor based in Tachikawa, Japan. He has made significant contributions to the field of display technology, holding a total of 2 patents. His work has been instrumental in advancing the functionality and design of display screens.

Latest Patents

Hasegawa's latest patents include innovations such as "Icon for a portion of a display screen" and "Icon for portion of display or screen." These patents reflect his commitment to enhancing user interface design and improving the overall user experience.

Career Highlights

Nao Hasegawa is currently employed at Olympus Imaging Corporation, where he continues to push the boundaries of display technology. His role at Olympus has allowed him to collaborate with other talented professionals in the industry.

Collaborations

Some of Hasegawa's notable coworkers include Kazuhiro Sato and Yasuo Funakoshi. Their collective expertise contributes to the innovative environment at Olympus Imaging Corporation.

Conclusion

Nao Hasegawa is a key figure in the realm of display technology, with a focus on creating user-friendly interfaces. His patents and collaborations highlight his dedication to innovation in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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