This inventor holds 1 USPTO granted patent. Top assignee: Lsi Logic Corporation. Active years: 1994.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1994
Title: Nanjunda Shastry: Innovator in Integrated Circuit Diagnosis
Introduction
Nanjunda Shastry is a prominent inventor based in Santa Clara, CA (US). He has made significant contributions to the field of integrated circuits, particularly in diagnosing failures within complex systems. His innovative approach has paved the way for advancements in circuit testing and analysis.
Latest Patents
Nanjunda Shastry holds a patent for a "Method and apparatus for integrated circuit diagnosis." This technique involves a tester that stimulates a device under test (DUT) with input patterns. The DUT outputs are communicated back to the tester and compared to simulation results. Failing outputs are identified, and through a schematic editor, suspect failing nodes are pinpointed. The process includes using a layout database linked to the schematic editor to identify the position of each suspect failing node. Probes and scanning electron microscopes (SEM) are then positioned at these nodes to compare live waveforms with simulated waveforms. This comprehensive method allows for the identification of failing circuit elements, with documentation provided through printed windows.
Career Highlights
Nanjunda Shastry has had a successful career at LSI Logic Corporation, where he has applied his expertise in integrated circuits. His work has been instrumental in enhancing the reliability and performance of electronic devices. He has collaborated with various professionals in the field, contributing to the advancement of technology.
Collaborations
One of his notable coworkers is Ramin Halaviati, with whom he has worked closely on various projects. Their collaboration has led to innovative solutions in integrated circuit diagnostics.
Conclusion
Nanjunda Shastry's contributions to integrated circuit diagnosis exemplify the impact of innovation in technology. His patented methods have significantly improved the ability to identify and analyze failures in complex circuits. His work continues to influence the field and inspire future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile