Tamil Nadu, India

Nandhu Rathi Rajendran

This inventor holds 1 USPTO granted patent. Top assignee: Bank of America Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nandhu Rathi Rajendran. Retrieved from https://idiyas.com/inventor/nandhu-rathi-rajendran

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nandhu Rathi Rajendran and Automated Anomaly Detection

Introduction

Nandhu Rathi Rajendran is an inventor associated with Tamil Nadu, India, and Bank of America Corporation. His patent work focuses on detecting and addressing anomalous data during automated data processing.

Latest Patents

Rajendran is credited with one patent: “System and Method for Detecting and Addressing Anomalous Data Based on Automated Data Analysis.” The invention receives application data and a request to perform an operation, such as transferring the data from one format to another. It then identifies an anomalous portion of the resulting data, compares it with historical application data linked to a solution instruction, and executes that instruction when a match is found. This approach is designed to help address anomalies through automated analysis.

Career Highlights

Rajendran’s listed patent reflects work on data transformation, anomaly detection, and automated remediation. His association with Bank of America Corporation places this innovation in the context of financial services and data-intensive operations.

Collaborations

Dhuvaraga Prasath B. is identified as Rajendran’s coworker. The available information does not specify whether they collaborated on this patent.

Conclusion

Nandhu Rathi Rajendran’s patent describes a method for identifying anomalous application data and applying a relevant solution instruction, highlighting the role of automation in data processing. 1 patent

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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