Murphy, TX, United States of America

Nancy J Scanlan

This inventor holds 1 USPTO granted patent. Top assignee: Banctec, Incorporated. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nancy J Scanlan. Retrieved from https://idiyas.com/inventor/nancy-j-scanlan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Nancy J. Scanlan

Introduction

Nancy J. Scanlan is a notable inventor based in Murphy, Texas. She has made significant contributions to the field of image processing technology. Her work focuses on enhancing the quality and usability of scanned images, which is crucial in various applications.

Latest Patents

Nancy J. Scanlan holds a patent for a "System and method for characterizing a scanned image artifact and modifying a scanned image based thereon." This innovative patent describes a scanned image processing system that includes an artifact characterizer and an image modifier. The artifact characterizer provides a characterization of artifacts present in scanned images, while the image modifier adjusts the images based on this characterization and operating parameters. This technology is essential for improving the clarity and accuracy of scanned documents.

Career Highlights

Throughout her career, Nancy has worked with Banctec, Incorporated, where she has applied her expertise in image processing. Her contributions have helped advance the company's capabilities in document conversion systems. Nancy's work exemplifies the intersection of technology and practical application, showcasing her commitment to innovation.

Conclusion

Nancy J. Scanlan's contributions to image processing technology highlight her role as a pioneering inventor. Her patent reflects her dedication to improving scanned image quality, making her a valuable figure in her field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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