Shizuoka, Japan

Nanami Kato

This inventor holds 1 USPTO granted patent and 10 published patent applications and 2 EPO patents. Top assignee: Canon Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nanami Kato. Retrieved from https://idiyas.com/inventor/nanami-kato

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nanami Kato: Inventor in Electrophotographic Technology.

Introduction

Nanami Kato is an inventor associated with Shizuoka, Japan, and Canon Kabushiki Kaisha. Her work includes an invention designed to support stable sensitivity in electrophotographic photosensitive members during repeated use.

Latest Patents

Kato is credited with 1 patent: “Electrophotographic Photosensitive Member, Process Cartridge, Electrophotographic Apparatus, and Method of Producing Electrophotographic Photosensitive Member.” The invention describes a photosensitive member comprising a support, an undercoat layer, a charge-generating layer, and a charge-transporting layer arranged in that order. The undercoat layer contains two kinds of electron-transporting substances, with the aim of maintaining stable sensitivity through repeated use.

Career Highlights

Kato’s listed patent work is connected to Canon Kabushiki Kaisha and focuses on electrophotographic imaging technology. The patent also addresses related process cartridges, electrophotographic apparatus, and a method for producing the photosensitive member.

Collaborations

Kato’s listed coworkers include Michiyo Sekiya and Akihiro Maruyama.

Conclusion

Nanami Kato’s patent reflects her contribution to electrophotographic technology through a photosensitive-member design intended to preserve stable performance during repeated use.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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