Gwangju, South Korea

Nam Won Kim

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Drtech Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nam Won Kim. Retrieved from https://idiyas.com/inventor/nam-won-kim-vyexszl6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Nam Won Kim

Introduction

Nam Won Kim is a notable inventor based in Gwangju, South Korea. He has made significant strides in the field of radiation detection technology. His work focuses on developing advanced apparatuses that enhance the efficiency and flexibility of radiation inspection.

Latest Patents

Nam Won Kim holds a patent for a radiation inspection apparatus that includes a radiation detector. This innovative device features a radiation detecting panel, a bending support unit, and a bending adjustment unit. The radiation detector is designed to be flexible, allowing it to extend in a first direction while effectively detecting radiation that is incident to its first face. The bending support unit, which is plate-shaped, is positioned on the second face of the radiation detecting panel. This unit supports the panel while maintaining a level of flexibility that is less than that of the radiation detecting panel itself.

Career Highlights

Nam Won Kim is currently employed at Drtech Corporation, where he continues to contribute to advancements in radiation detection technology. His work is characterized by a commitment to innovation and practical applications in the field.

Collaborations

Some of his coworkers include Hyeong Sik Kim and Beom Jin Moon, who collaborate with him on various projects within the company.

Conclusion

Nam Won Kim's contributions to radiation detection technology exemplify the spirit of innovation. His patent reflects a significant advancement in the field, showcasing his dedication to improving safety and efficiency in radiation inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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