Naixing Wang

Title: Naixing Wang: Innovator in Test Pattern Generation

Introduction

Naixing Wang is a prominent inventor based in Tigard, Oregon. He has made significant contributions to the field of automatic test pattern generation (ATPG). His work focuses on enhancing the reliability and efficiency of circuit designs.

Latest Patents

Naixing Wang holds a patent titled "Deterministic test pattern generation for designs with timing exceptions." This patent describes systems and methods for a deterministic ATPG process that incorporates timing exception information. The method involves generating a test pattern for a targeted fault in a circuit design that includes at least one timing exception path. The process also includes testing the targeted fault using the generated test pattern to produce a test result.

Career Highlights

Wang is associated with Mentor Graphics Corporation, a leading company in electronic design automation. His work at the company has been instrumental in advancing testing methodologies for complex circuit designs.

Collaborations

Naixing Wang has collaborated with notable colleagues, including Wu-Tung Cheng and Kun-Han Tsai. Their combined expertise has contributed to the development of innovative solutions in the field of circuit testing.

Conclusion

Naixing Wang's contributions to the field of test pattern generation demonstrate his commitment to improving circuit design reliability. His innovative patent and collaboration with esteemed colleagues highlight his role as a key figure in the industry.