Tokyo, Japan

Nagisa Matsumoto

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Hitachi Construction Machinery. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nagisa Matsumoto. Retrieved from https://idiyas.com/inventor/nagisa-matsumoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nagisa Matsumoto: Machine Performance Diagnostics

Introduction

Nagisa Matsumoto is an inventor associated with Hitachi Construction Machinery in Tokyo, Japan. His work includes a patented device designed to measure and diagnose machine performance. The provided information lists 1 patent for Matsumoto.

Latest Patents

Matsumoto’s listed patent is titled “Performance Diagnostic Device for Machine.” The device acquires information about a machine’s condition, preprocesses that information, and analyzes its frequency characteristics. It distinguishes candidate frequencies associated with the machine’s state from frequencies indicating noise, then estimates which candidate best represents the machine’s condition. A performance-measuring and diagnosing section evaluates the machine, while a display section presents information.

Career Highlights

Matsumoto’s listed invention focuses on using frequency analysis to support machine performance assessment. By accounting for noise when identifying relevant frequency features, the device is designed to help diagnose a machine’s operating state.

Collaborations

The supplied information identifies Masayuki Kakida as Matsumoto’s coworker. It does not specify their roles in developing the patent or describe any particular collaboration.

Conclusion

Nagisa Matsumoto’s listed patent reflects an engineering approach to machine diagnostics that combines condition-data processing, frequency analysis, and performance assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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