Santa Clara, CA, United States of America

Nagib Z Hakim


Average Co-Inventor Count = 42.9

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):

Title: Innovations in Testing: The Ingenious Mind of Nagib Z. Hakim

Introduction

Nagib Z. Hakim, an accomplished inventor based in Santa Clara, CA, has made significant contributions to the field of electronic testing and validation. His innovative work primarily focuses on developing advanced architectures that streamline the processes of testing, validation, and debugging in electronic parts and devices.

Latest Patents

Hakim holds one patent, which encompasses an apparatus and method for providing a comprehensive test, validation, and debug architecture. This invention involves integrating hardware hooks known as Design for Test (DFx) into silicon components. Through a controller, the design provides abstracted access to these hooks via an abstraction layer, which simplifies the complexity of testing for developers. The architecture includes an interface for higher-level software to interact with the test system, enabling efficient collection of test data necessary for validation and debugging. Additionally, it offers secure access tiers and eases physical connections through a unified, bi-directional test access port, allowing for local and remote testing and debugging of electronic platforms.

Career Highlights

Nagib Z. Hakim is currently associated with Intel Corporation, where his expertise in testing architecture is invaluable. His inventive spirit and contributions have fundamentally enhanced the capabilities of electronic devices, facilitating easier validation and debugging processes across various platforms.

Collaborations

Throughout his career, Hakim has collaborated with esteemed colleagues, including Mark B. Trobough and Keshavan K. Tiruvallur. Together, they have fostered an innovative environment that emphasizes the importance of robust testing methodologies in electronics engineering.

Conclusion

Nagib Z. Hakim's contributions to the field of electronic testing illustrate the vital role of innovation in enhancing technology. His inventive patent not only represents a significant technical advancement but also sets the foundation for future explorations in test architecture. With the support of leading technology companies like Intel Corporation and collaborations with talented colleagues, Hakim continues to influence and shape the landscape of electronic development.

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