Hyderabad Telangana, India

Nagesh M V G V

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nagesh M V G V. Retrieved from https://idiyas.com/inventor/nagesh-m-v-g-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 80(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Nagesh M V G V: Innovator in Testing Automation

Introduction

Nagesh M V G V is a prominent inventor based in Hyderabad, Telangana, India. He has made significant contributions to the field of software testing automation. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing processes.

Latest Patents

Nagesh holds a patent for "End to end testing automation and parallel test execution." This invention focuses on provisioning and configuring machines, both real and virtual, for the parallel execution of multiple test cases. These test cases correspond to various software configurations, such as different platform and product version configurations, and are executed at substantially overlapping times, thereby optimizing the testing process.

Career Highlights

Nagesh is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to leverage his expertise in software testing and automation, contributing to the company's innovative projects and solutions.

Collaborations

Nagesh has collaborated with several talented individuals in his field, including Ritesh Kumar Gupta and Santosh K Janumahanthi. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Nagesh M V G V is a notable inventor whose work in testing automation has made a significant impact in the software industry. His patent demonstrates his commitment to improving testing efficiency and effectiveness.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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