Company Filing History:
Years Active: 2003-2010
Title: Innovations by Inventor Nadav Haas
Introduction
Nadav Haas is an accomplished inventor based in Merkaz Shapira, Israel. He has made significant contributions to the field of charged particle devices, holding two patents that enhance the examination and evaluation of specimens.
Latest Patents
Haas's latest patents include a method and system for the examination of specimens using a beam of charged particles. This innovative method allows for the generation of multiple images from different view angles, providing extensive information about the specimen. By tilting the beam and repositioning the specimen, Haas's method ensures that the same area is scanned, leading to more comprehensive data collection. Another notable patent focuses on the automatic evaluation of charged particle devices. This method utilizes signals from a gold-on-carbon reference target to determine the spot size of the particle beam. The approach enhances consistency, accuracy, and reliability in beam characterization, ultimately improving the quality of the system's performance.
Career Highlights
Nadav Haas is currently employed at Applied Materials, Inc., where he continues to innovate in the field of charged particle technology. His work has been instrumental in advancing the capabilities of examination and evaluation methods in various applications.
Collaborations
Haas collaborates with talented colleagues, including Asher Pearl and Yacov Elgar, who contribute to the development and refinement of his innovative projects.
Conclusion
Nadav Haas is a notable inventor whose work in charged particle devices has led to significant advancements in specimen examination and evaluation methods. His contributions continue to impact the field positively.