Location History:
- Armonk, NY (US) (1992 - 2001)
- Berkeley, CA (US) (1979 - 2007)
Company Filing History:
6 out of 164,197 
3 out of 3,975 
Years Active: 1979-2007
Title: Nabil M Amer: Innovator in Authenticity and Microscopy
Introduction
Nabil M Amer is a distinguished inventor based in Berkeley, CA. He holds a total of 9 patents that showcase his innovative contributions to technology and science. His work primarily focuses on methods for ensuring authenticity and advancements in atomic force microscopy.
Latest Patents
Among his latest patents is a method and apparatus for producing duplication- and imitation-resistant identifying marks on objects. This invention guarantees the authenticity of an object by utilizing a sample of material that is obtainable only through specific chemical and physical processes. The method involves associating a reproducible number to the sample using a specific reader and forming a coded version of the number, which is recorded into an area of the object. Another significant patent is related to atomic force microscopy, which includes a tip mounted on a micromachined cantilever. This atomic force microscope scans surfaces to investigate interatomic forces, providing a topographical image of the surface with atomic resolution.
Career Highlights
Nabil M Amer has worked with notable organizations, including IBM and the United States of America as represented by the United States. His experience in these prestigious companies has contributed to his expertise and innovative capabilities in his field.
Collaborations
Throughout his career, Nabil has collaborated with esteemed colleagues such as Gerhard Meyer and David Peter DiVincenzo. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Nabil M Amer is a prominent figure in the realm of innovation, particularly in the fields of authenticity and microscopy. His patents reflect a commitment to advancing technology and ensuring the integrity of objects in various applications.