The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 1998

Filed:

Aug. 01, 1996
Applicant:
Inventors:

Nabil Mahmoud Amer, Berkeley, CA (US);

David Peter DiVincenzo, Chappaqua, NY (US);

Neil Gershenfeld, Somerville, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
340571 ; 340557 ; 340553 ; 340555 ; 340568 ; 342 28 ; 250221 ;
Abstract

The multiple scattering of coherent radiation in an inhomogeneous medium is used to detect attempted intrusions into a protected area or into a tamper-proof package for such purposes as preventing the unauthorized detection and copying of electronic information used for authentication and coding in electronic commerce, communications, command, and control systems. A key advantage is that any intrusion into the sensed volume will produce a detected change in the measured intensity which will be equal to the full amplitude range if the intrusion is into a cylinder with radius comparable to the wavelength of the sensing radiation. The response of the medium can also be used to provide a unique identity key.


Find Patent Forward Citations

Amer, Nabil. (1998). Tamper detection using bulk multiple scattering (U.S. Patent No. 5790025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5790025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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