Shenzhen, China

Na-Na Zhai

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Na-Na Zhai. Retrieved from https://idiyas.com/inventor/na-na-zhai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Na-Na Zhai: Innovator in Luminous Intensity Testing

Introduction

Na-Na Zhai is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of luminous intensity testing. His innovative approach has led to the development of a unique device that enhances the accuracy of luminous intensity measurements.

Latest Patents

Na-Na Zhai holds 1 patent for his invention titled "Luminous Intensity Test Device." This device includes an optical frequency converter, a display, and a processor. The optical frequency converter selectively converts light emitted by a light source into a digital signal. The display features a color selection interface, allowing users to input color parameters. The processor processes the digital signal to obtain and display the luminous intensity.

Career Highlights

Throughout his career, Na-Na Zhai has worked with prominent companies, including Fu Tai Hua Industry (Shenzhen) Co., Ltd. and Hon Hai Precision Industry Co., Ltd. His experience in these organizations has contributed to his expertise in the field of optical technology.

Collaborations

Na-Na Zhai has collaborated with talented individuals such as Chun-Yan Yang and Yu-Cui Zhou. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Na-Na Zhai's contributions to luminous intensity testing exemplify the spirit of innovation. His patented device showcases his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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