Seongnam, South Korea

MyungWoon Hwang

This inventor holds 1 USPTO granted patent. Top assignee: Fci, Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: MyungWoon Hwang. Retrieved from https://idiyas.com/inventor/myungwoon-hwang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: MyungWoon Hwang: Innovator in Automatic Gain Control Technology.

Introduction

MyungWoon Hwang is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of automatic gain control technology. His innovative approach has led to the development of a unique apparatus and method that enhances signal processing efficiency.

Latest Patents

Hwang holds a patent for an "Apparatus and method for automatic gain control." This invention focuses on rapidly and effectively completing automatic gain control by performing a gain control procedure only three times, regardless of the intensity of a received signal. The method utilizes peak values in an analog region and the output signal of an analog-digital converter, showcasing Hwang's expertise in signal processing.

Career Highlights

MyungWoon Hwang is currently employed at FCI, Inc., where he continues to innovate and develop new technologies. His work has garnered attention for its practical applications in various electronic devices.

Collaborations

Hwang collaborates with talented individuals such as Hyun Soo Kang and Beomjin Kim. Their combined efforts contribute to the advancement of technology in their field.

Conclusion

MyungWoon Hwang's contributions to automatic gain control technology exemplify his innovative spirit and dedication to improving signal processing methods. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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