Myung-Ho Jung

Title: Myung-Ho Jung: Innovator in Semiconductor Inspection Technology

Introduction

Myung-Ho Jung is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor device inspection, holding two patents that showcase his innovative approach to technology. His work is instrumental in enhancing the efficiency and accuracy of device testing processes.

Latest Patents

Myung-Ho Jung's latest patents include a "System and method of inspecting device under test" and a "Method of manufacturing semiconductor device." The inspection system for a device under test (DUT) incorporates an image sensor, multiple image obtaining devices, switches, and image processing devices. This system allows for real-time processing of image data captured from the DUT, significantly improving inspection capabilities. Additionally, his method for inspecting flat panel displays involves inputting image data signals, capturing images with a camera, and analyzing brightness information to detect stains beyond permitted limits.

Career Highlights

Myung-Ho Jung is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His role involves developing advanced inspection systems that are crucial for maintaining high-quality standards in semiconductor manufacturing. His expertise in image processing and inspection methodologies has positioned him as a key player in his field.

Collaborations

Myung-Ho Jung has collaborated with notable colleagues, including Jae-wan Kim and Hyoung-jo Jeon. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas, further enhancing the development of cutting-edge technologies.

Conclusion

Myung-Ho Jung's contributions to semiconductor inspection technology reflect his dedication to innovation and excellence. His patents and work at Samsung Electronics Co., Ltd. demonstrate his significant impact on the industry.