The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Sep. 27, 2004
Jae-wan Kim, Anyang-si, KR;
Hyoung-jo Jeon, Suwon-si, KR;
Yong-sik Douglas Kim, Seoul, KR;
Hwa-sub Shim, Suwon-si, KR;
Heong-min Ahn, Youngin-si, KR;
Ho-seok Choi, Seoul, KR;
Myung-ho Jung, Suwon-si, KR;
Min Hong, Seoul, KR;
Joung-hag Kim, Suwon-si, KR;
Young-su Ryu, Suwon-si, KR;
Sung-chai Kim, Suwon-si, KR;
Seung-gun Byoun, Suwon-si, KR;
Suk-in Yoo, Seoul, KR;
Kyu-nam Choi, Seoul, KR;
Jae-yeong Lee, Seoul, KR;
Jae-wan Kim, Anyang-si, KR;
Hyoung-jo Jeon, Suwon-si, KR;
Yong-sik Douglas Kim, Seoul, KR;
Hwa-sub Shim, Suwon-si, KR;
Heong-min Ahn, Youngin-si, KR;
Ho-seok Choi, Seoul, KR;
Myung-ho Jung, Suwon-si, KR;
Min Hong, Seoul, KR;
Joung-hag Kim, Suwon-si, KR;
Young-su Ryu, Suwon-si, KR;
Sung-chai Kim, Suwon-si, KR;
Seung-gun Byoun, Suwon-si, KR;
Suk-in Yoo, Seoul, KR;
Kyu-nam Choi, Seoul, KR;
Jae-yeong Lee, Seoul, KR;
Samsung Electronics Co., Ltd, Suwon-si, KR;
Abstract
A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.