Suwon, South Korea

Myoung Hoon Kim

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: Samsung Electro-Mechanics. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Myoung Hoon Kim. Retrieved from https://idiyas.com/inventor/myoung-hoon-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Myoung Hoon Kim and His Firing Furnace Patent.

Introduction

Myoung Hoon Kim is an inventor based in Suwon, South Korea. His listed patent is associated with Samsung Electro-Mechanics, where he works.

Latest Patents

Kim’s patent, “Firing furnace,” describes a furnace with an internal passage extending from an inlet to an outlet. Three heating portions are arranged in the upper, central, and lower sections of the passage, with transporting rollers positioned between the first and second heating portions and between the second and third heating portions. The distance between the upper and central heating portions is greater than the distance between the central and lower heating portions. Kim is credited with 1 patent.

Career Highlights

Kim’s recorded invention focuses on the arrangement of heating portions and transporting rollers within a firing furnace. The patent identifies Samsung Electro-Mechanics as his company.

Collaborations

The provided information lists Seung On Kang and Wan Ho Chung as Kim’s coworkers. Their names are included here as professional associations, without implying a specific role in the patent.

Conclusion

Myoung Hoon Kim’s recorded patent presents a firing furnace design with a defined arrangement of heating zones and transporting rollers, reflecting his documented inventive work at Samsung Electro-Mechanics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…