Chennai, India

Murali Krishnaan G

This inventor holds 1 USPTO granted patent. Top assignee: Hcl Technologies Limited. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Murali Krishnaan G. Retrieved from https://idiyas.com/inventor/murali-krishnaan-g

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Biography of Inventor Murali Krishnaan G

Introduction

Murali Krishnaan G is an innovative inventor based in Chennai, India. He has made significant contributions to the field of technology, particularly in the use of drones for testing devices. His work exemplifies the intersection of engineering and practical application.

Latest Patents

Murali holds a patent for a "System and a method for facilitating testing of plurality of devices using a drone." This invention discloses a system and method that enables the testing of multiple devices through a drone. The process involves a locating module that identifies the drone's position relative to the devices, an image capturing unit that receives images of the devices, and a comparing module that assesses these images against reference images. Based on the comparison, a determining module decides the necessary actions for testing, which are then facilitated by a snout associated with the drone.

Career Highlights

Murali is currently employed at HCL Technologies Limited, where he continues to develop and refine his innovative ideas. His work at HCL has allowed him to collaborate with other talented professionals in the field.

Collaborations

Throughout his career, Murali has worked alongside notable colleagues such as Siva Sakthivel Sadasivam and Vishal Chaudhary. These collaborations have enriched his experience and contributed to the success of his projects.

Conclusion

Murali Krishnaan G is

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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