Kanagawa, Japan

Muneyuki Hamabe

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Ricoh Company, Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Muneyuki Hamabe. Retrieved from https://idiyas.com/inventor/muneyuki-hamabe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Muneyuki Hamabe: Innovator in Image Attribute Processing

Introduction

Muneyuki Hamabe is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of image processing, particularly through his innovative patent that enhances the analysis of image attributes.

Latest Patents

Hamabe holds a patent for an "Image attribute processing system, image attribute processing apparatus, and method of processing image attributes." This information processing system utilizes machine learning to analyze appearance attributes of individuals based on acquired image data. The system is designed to store feature value patterns associated with various groups of persons, allowing for a more accurate analysis of a target person's attributes.

Career Highlights

Muneyuki Hamabe is currently employed at Ricoh Company, Ltd., where he applies his expertise in image processing technologies. His work focuses on developing advanced systems that leverage machine learning for improved image analysis.

Collaborations

Some of his notable coworkers include Tomoyuki Tazuke and Akihiro Kakinuma, who contribute to the innovative projects at Ricoh Company, Ltd.

Conclusion

Muneyuki Hamabe's work in image attribute processing exemplifies the intersection of technology and innovation. His contributions continue to influence advancements in the field of image analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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