Istanbul, Turkey

Muhsin Eralp

This inventor holds 1 USPTO granted patent. Top assignee: Koç Üniversitesi. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Muhsin Eralp. Retrieved from https://idiyas.com/inventor/muhsin-eralp-ipc016fn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Muhsin Eralp: Innovator in Imaging Technology

Introduction

Muhsin Eralp is a notable inventor based in Istanbul, Turkey. He has made significant contributions to the field of imaging technology, particularly with his innovative patent that combines display and imaging systems.

Latest Patents

Eralp holds a patent for a "Dual function display and multi-view imaging system." This system is designed as a wearable device that integrates a double-function image display with an image capturing screen. The technology aims to project images while simultaneously capturing 3D ambient visuals using a camera. The system includes an image capturing device, a projector assembly, and a passive screen, allowing for optical communication between the components.

Career Highlights

Muhsin Eralp is affiliated with Koc Universitesi, where he contributes to research and development in imaging technologies. His work focuses on enhancing the capabilities of display systems and their applications in various fields.

Collaborations

Eralp has collaborated with notable colleagues, including Hakan Urey and Shoaib Soomro, to advance his research and innovations in imaging technology.

Conclusion

Muhsin Eralp's contributions to the field of imaging technology through his innovative patent demonstrate his commitment to advancing the capabilities of display systems. His work continues to influence the development of new technologies in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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