Nashua, NH, United States of America

Mugdha Kulkarni

This inventor holds 1 USPTO granted patent. Top assignee: Emc Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mugdha Kulkarni. Retrieved from https://idiyas.com/inventor/mugdha-kulkarni-ezwhkljt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Mugdha Kulkarni: Inventor in Storage Network Virtualization.

Introduction

Mugdha Kulkarni is an inventor associated with Nashua, New Hampshire, and EMC Corporation. Her patent work addresses networked storage access and virtualization.

Latest Patents

The available information identifies one patent associated with Kulkarni: “Scalable Storage Network Virtualization.” It describes a storage system in which a virtualization controller maps a virtual target to one or more physical storage devices on a network. An initiator receives that mapping and uses a virtualization client to translate requests directed to the virtual target into requests for the corresponding physical storage device. Kulkarni is credited with 1 patent in the information provided.

Career Highlights

Kulkarni’s documented invention focuses on making storage resources accessible through a virtualized network architecture. The patent describes how a controller and initiator can work together to direct access requests to physical storage devices.

Collaborations

The provided information lists Ron Stern as a coworker. Kulkarni is also associated with EMC Corporation, a company connected to her patent work.

Conclusion

Mugdha Kulkarni’s patent on scalable storage network virtualization reflects an approach to managing networked storage through virtual targets and mapped physical devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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