Tokyo, Japan

Motoyuki Ogasawara

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Toppan Holdings Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Motoyuki Ogasawara. Retrieved from https://idiyas.com/inventor/motoyuki-ogasawara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Motoyuki Ogasawara: Innovator in Millimeter Wave Technology

Introduction

Motoyuki Ogasawara is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of millimeter wave technology. His innovative work has led to the development of a unique decorative material that reflects millimeter waves.

Latest Patents

Ogasawara holds a patent for a "Millimeter wave reflective decorative material and method of installing the same." This invention includes a planar dielectric and a supercell on its first surface, featuring a variety of metal patterns in different shapes. This technology has potential applications in various industries, enhancing both functionality and aesthetics.

Career Highlights

Motoyuki Ogasawara is associated with Toppan Holdings Inc., a leading company in the printing and information services sector. His role at Toppan has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Tomohiko Sato and Yusuke Takahashi. Their combined expertise contributes to the innovative projects at Toppan Holdings Inc.

Conclusion

Motoyuki Ogasawara's work in millimeter wave technology exemplifies the spirit of innovation. His contributions continue to influence advancements in decorative materials and their applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…