Nagaoka, Japan

Motonori Kawasaki

This inventor holds 1 USPTO granted patent. Top assignee: Nagaoka University of Technology. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Motonori Kawasaki. Retrieved from https://idiyas.com/inventor/motonori-kawasaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

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Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Motonori Kawasaki: Innovator in Ultrasonic Measurement Technology

Introduction

Motonori Kawasaki is a notable inventor based in Nagaoka, Japan. He has made significant contributions to the field of ultrasonic measurement technology. His innovative approach has led to the development of a unique ultrasonic measurement waveguide rod.

Latest Patents

Kawasaki holds a patent for an ultrasonic measurement waveguide rod and ultrasonic measurement instrument. This invention is designed to be easy to manufacture while effectively preventing noise echoes. The ultrasonic flaw detection waveguide rod features a probe at one end and a contact surface at the other end, which interacts with the test piece. The rod's cross-sectional shape is a polygon, ensuring that at least one pair of opposing sides is not parallel. This design allows ultrasonic waves to reflect off the non-parallel surfaces, minimizing the chances of noise echoes returning to the probe.

Career Highlights

Kawasaki is affiliated with the Nagaoka University of Technology, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in ultrasonic measurement.

Collaborations

Kawasaki collaborates with Ikuo Ihara, contributing to the advancement of ultrasonic technologies.

Conclusion

Motonori Kawasaki's innovative work in ultrasonic measurement technology exemplifies the impact of thoughtful design in engineering. His contributions continue to influence the field and enhance measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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