Waldheim, Germany

Moritz Woischke

This inventor holds 1 USPTO granted patent. Top assignee: Endress+hauser Conducta Gmbh+co. Kg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Moritz Woischke. Retrieved from https://idiyas.com/inventor/moritz-woischke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Moritz Woischke: Modular Measurement Technology

Introduction

Moritz Woischke is an inventor associated with Waldheim, Germany, and Endress+Hauser Conducta GmbH+Co. KG. His patent work concerns modular analytical equipment for measuring chemical and physical properties of fluids.

Latest Patents

Woischke is named on 1 patent: “Modular Measuring Cell for Measuring Chemical and/or Physical Properties of a Fluid.” The invention describes a system of interconnected flow-through measuring-cell modules, each with a flow channel, measuring chamber, sensor opening, and axisymmetrically arranged connectors. Adapters join adjacent modules and connect their flow channels into a main line. Complementary connecting elements allow the modules to be assembled in a predetermined number of orientations around their axis of symmetry.

Career Highlights

The patent reflects work on adaptable measuring-cell design for analytical technology. Its modular arrangement allows multiple measuring cells to be connected while accommodating different orientations, supporting flexible configurations for fluid measurement.

Collaborations

The patent record associates Woischke with Endress+Hauser Conducta GmbH+Co. KG, a company working in measurement and analytical technology.

Conclusion

Moritz Woischke’s documented invention focuses on a configurable modular measuring cell that connects fluid channels and supports sensor-based analysis of chemical and physical properties.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…