Moosong Lee

Title: Moosong Lee: Semiconductor Measurement and Device-Structure Patents

Introduction

Moosong Lee is an inventor based in Suwon-si, South Korea. His listed work includes two patents related to semiconductor manufacturing and device structures. He is associated with Samsung Electronics Ltd.

Latest Patents

Lee’s listed patents address overlay measurement and semiconductor device design.

“Overlay measuring method and system, and method of manufacturing a semiconductor device using the same” describes scanning an overlay mark with programmed overlay values using an electron beam to produce a voltage-contrast image. The method derives a defect function from the image data and uses self-cross-correlation to determine overlay.

“Semiconductor device having overlay structures in a key region” describes a semiconductor substrate with a key region containing a dummy active pattern, impurity regions, a line structure, a dummy gate electrode, and a dummy contact. The contact includes multiple elongated contacts arranged in a direction crossing the line structure.

Career Highlights

Lee’s two listed patents focus on techniques and structures relevant to semiconductor fabrication. One concerns measuring overlay, while the other describes device features in a semiconductor key region. The supplied information lists two patents for Lee.

Collaborations

Jinsun Kim and Inho Kwak are identified as Lee’s coworkers. The provided information does not specify their roles in the listed patents.

Conclusion

Moosong Lee’s listed patent work reflects contributions to semiconductor overlay measurement and device design, alongside his association with Samsung Electronics Ltd.