Suwon-si, South Korea

Moorim Kim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Moorim Kim. Retrieved from https://idiyas.com/inventor/moorim-kim-d9iewoiv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Moorim Kim and His Patent for Biometric Signal Measurement

Introduction

Moorim Kim is an inventor based in Suwon-si, South Korea, and is associated with Samsung Electronics Co., Ltd. His patent work includes technology for measuring biometric signals with an electronic device.

Latest Patents

Kim is named on one patent: “Electronic Device for Measuring Biometric Signal and Method of Operating the Same.” The invention describes an electronic device with a sensor module, a communication circuit, and at least one processor. The processor identifies how the device is mounted using sensor data, then selects a suitable combination of transmitting and receiving antennas. It obtains a radar signal related to a measurement target, derives a biometric signal from that radar signal, evaluates the signal’s quality, and adjusts antenna control parameters based on the sensor data, radar signal, and signal quality. Kim’s listed portfolio includes 1 patent.

Career Highlights

Kim’s disclosed patent work focuses on combining radar sensing, antenna selection, and signal-quality evaluation to support biometric measurement. The patent identifies Samsung Electronics Co., Ltd. as his company affiliation.

Collaborations

Minhyoung Lee and DoYoon Kim are listed as Kim’s coworkers. The provided information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Moorim Kim’s patent describes an adaptive approach to biometric signal measurement that uses sensor data and radar signals to select and tune antenna combinations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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