Bloomsdale, MO, United States of America

Moheb Y Loutfi

This inventor holds 2 USPTO granted patents. Top assignee: Holcim (US), Inc.. Active years: 2013-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Moheb Y Loutfi. Retrieved from https://idiyas.com/inventor/moheb-y-loutfi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 2013-2014

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2 patents (USPTO):Explore Patents

Title: Moheb Y Loutfi: Innovator in Plant Equipment Monitoring

Introduction

Moheb Y Loutfi is a notable inventor based in Bloomsdale, MO (US). He has made significant contributions to the field of plant equipment monitoring, holding 2 patents that showcase his innovative approach to enhancing industrial processes.

Latest Patents

Loutfi's latest patents include a system for monitoring plant equipment. This system provides an automated analysis framework where software instructions compare sensor data to predefined values, allowing for the identification of mechanical problems across multiple machines. Additionally, his cement manufacturing system incorporates sensors that monitor the movement conditions of cement-making machines. A central computer is connected to vibration sensors associated with these machines, enabling real-time comparisons and performance determinations based on sensed signals.

Career Highlights

Moheb Y Loutfi is currently associated with Holcim (US), Inc., where he applies his expertise in monitoring systems to improve operational efficiency. His work focuses on integrating advanced technology into traditional manufacturing processes, thereby enhancing productivity and reducing downtime.

Conclusion

Moheb Y Loutfi's contributions to plant equipment monitoring reflect his commitment to innovation in the industrial sector. His patents demonstrate a forward-thinking approach that addresses real-world challenges in manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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