Bengaluru, India

Mohammed Jafer

This inventor holds 1 USPTO granted patent. Top assignee: Target Brands, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mohammed Jafer. Retrieved from https://idiyas.com/inventor/mohammed-jafer-7y1kbhrc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mohammed Jafer: Innovator in Data Extraction Technology

Introduction

Mohammed Jafer is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of data extraction technology. His innovative approach has led to the development of a unique service that enhances the efficiency of data processing.

Latest Patents

Jafer holds a patent for a data extraction service. This service is designed to receive an image containing a data table. It performs optical character recognition on the image to identify and label the text within the table. The service then generates a digital data table that corresponds to the original data table in the image. Finally, it formats the digital data table and provides it to a downstream entity for further use. He has 1 patent to his name.

Career Highlights

Currently, Mohammed Jafer is employed at Target Brands, Inc. His work at the company focuses on leveraging technology to improve data management processes. His innovative solutions have garnered attention within the industry.

Collaborations

Jafer collaborates with talented individuals such as Neha Dixit and Nishtha Gupta. Together, they work on various projects that aim to push the boundaries of data extraction and processing technologies.

Conclusion

Mohammed Jafer is a pioneering inventor whose work in data extraction technology is making a significant impact. His contributions are paving the way for more efficient data management solutions in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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