Rochester, NY, United States of America

Mohammad Mirhosseini

This inventor holds 1 USPTO granted patent. Top assignee: University of Rochester. Active years: 2016.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Mohammad Mirhosseini

Introduction

Mohammad Mirhosseini is an accomplished inventor based in Rochester, NY (US). He has made significant contributions to the field of optical engineering, particularly in wavefront sensing technologies. His innovative work has led to the development of a unique patent that enhances the measurement of optical beams.

Latest Patents

Mirhosseini holds a patent for a "Wavefront sensing apparatus, method and applications." This invention utilizes a wavefront sensing technique known as Polarization Rotation Interferometry (PRINT). It provides a self-referencing, high-resolution, direct measurement of the spatially dependent phase profile of a given optical beam. The technique employs a self-referencing method to create a reference beam in orthogonal polarization. It also incorporates polarization measurement to assess the spatial-dependent polarization parameters, allowing for the direct determination of the absolute phase profile of the beam under test. This innovation enables high-resolution direct measurement of the spatially-resolved phase profile of one or more optical beams.

Career Highlights

Mirhosseini is affiliated with the University of Rochester, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various optical technologies.

Collaborations

Some of his notable coworkers include Mehul Malik and Zhimin Shi, who contribute to the collaborative research environment at the University of Rochester.

Conclusion

Mohammad Mirhosseini's contributions to wavefront sensing technology exemplify the innovative spirit of modern engineering. His patent reflects a significant advancement in optical measurement techniques, showcasing his expertise and dedication to the field.

Profile summary based on public USPTO records.
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