Austin, TX, United States of America

Mohamed S Moosa

This inventor holds 1 USPTO granted patent. Top assignee: Clemson University. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mohamed S Moosa. Retrieved from https://idiyas.com/inventor/mohamed-s-moosa-5l28yuap

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 122(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Innovations by Inventor Mohamed S Moosa

Introduction

Mohamed S Moosa is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of integrated circuit design through his innovative patent. His work focuses on predicting defect-related failures in integrated circuits, which is crucial for enhancing the reliability of electronic devices.

Latest Patents

Mohamed S Moosa holds a patent for "Systems, methods and computer program products for predicting defect-related failures in integrated circuits." This patent outlines a comprehensive approach to identifying objects in a circuit layout, generating sample object defects, and predicting the reliability of integrated circuits based on defect magnitudes. The methodology includes the use of accelerated life defect influence models, which are essential for understanding the relationship between defect magnitudes and object lifetimes.

Career Highlights

Currently, Mohamed S Moosa is associated with Clemson University, where he continues to advance his research in integrated circuit reliability. His expertise in this area has positioned him as a valuable contributor to the academic and technological communities.

Collaborations

Mohamed has collaborated with Kelvin F Poole, further enhancing the scope and impact of his research endeavors.

Conclusion

In summary, Mohamed S Moosa is a notable inventor whose work in predicting defect-related failures in integrated circuits has significant implications for the reliability of electronic devices. His contributions continue to influence the field of integrated circuit design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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