Company Filing History:
Years Active: 2004
Title: Innovations of Mohamed Kamel Amara
Introduction
Mohamed Kamel Amara is an accomplished inventor based in Dover, DE (US). He has made significant contributions to the field of optics, particularly in the measurement of thin films. His innovative approach has led to the development of a unique method that enhances the accuracy of optical measurements.
Latest Patents
One of his notable patents is titled "Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films." This invention utilizes a beam deflection technique to measure the thickness, refractive index, and optical absorption of transparent materials. The method involves measuring beam deflection after transmission through or reflection off a sample at variable incidence angles. By applying Snell's Law, the measurements can be directly related to the sample's thickness and index of refraction.
Career Highlights
Mohamed Kamel Amara is associated with the Applied Optics Center of Delaware, Inc., where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various industries that rely on precise optical measurements.
Collaborations
He has collaborated with notable colleagues, including Noureddine Melikechi and Sabbir M Mian, who share his passion for advancing optical technologies.
Conclusion
Mohamed Kamel Amara's contributions to the field of optics through his innovative patent demonstrate his commitment to enhancing measurement techniques. His work continues to influence the industry and inspire future innovations.