This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1989.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1989
Title: Innovations of Mohamed I Al-Sheikhly
Introduction
Mohamed I Al-Sheikhly is an accomplished inventor based in Gaithersburg, MD (US). He has made significant contributions to the field of radiation dosimetry through his innovative designs and patents. His work focuses on creating devices that enhance the accuracy and reliability of radiation exposure measurements.
Latest Patents
One of his notable patents is the "Color-matched, ambient-light visual comparator dosimeter." This radiation dosimeter features an optical waveguide that encloses a radiation-sensitive material. This material changes color or color intensity with increasing exposure to high-energy ionizing radiation. The design includes a light-transparent, radiation-transparent light-transmitting member, which is separated from the radiation-sensitive material by a light-opaque sidewall. The dosimeter is equipped with a light transmission comparator that allows for accurate determination of radiation exposure under various ambient lighting conditions.
Career Highlights
Throughout his career, Mohamed I Al-Sheikhly has demonstrated a commitment to advancing technology in radiation measurement. His innovative approach has led to the development of a device that not only measures radiation exposure but also adapts to different lighting environments, ensuring precise readings.
Collaborations
Mohamed has collaborated with several professionals in his field, including Walter J Chappas and Mahnaz Farahani. These collaborations have contributed to the refinement and success of his inventions.
Conclusion
Mohamed I Al-Sheikhly's contributions to radiation dosimetry exemplify the impact of innovative thinking in science and technology. His patented designs continue to enhance the safety and accuracy of radiation exposure assessments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile