Tokorozawa, Japan

Miyako Negishi

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miyako Negishi. Retrieved from https://idiyas.com/inventor/miyako-negishi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: The Innovations of Miyako Negishi

Introduction

Miyako Negishi is a prominent inventor based in Tokorozawa, Japan. She has made significant contributions to the field of technology, particularly in the area of facility inspection support systems. Her work has garnered attention for its practical applications and innovative approach.

Latest Patents

Miyako Negishi holds a patent for a facility inspection support apparatus. This invention is designed to enhance the efficiency and accuracy of facility inspections, showcasing her commitment to improving operational processes in various industries. She has 1 patent to her name, reflecting her innovative spirit and technical expertise.

Career Highlights

Negishi is currently employed at Kabushiki Kaisha Toshiba, a leading technology company known for its advancements in electronics and information technology. Her role at Toshiba allows her to work on cutting-edge projects that push the boundaries of technology and innovation.

Collaborations

Throughout her career, Miyako has collaborated with notable colleagues, including Shigenobu Shirata and Kensuke Kawai. These partnerships have enabled her to leverage diverse expertise and contribute to successful projects within her field.

Conclusion

Miyako Negishi's contributions to technology through her patent and work at Toshiba highlight her as a key figure in innovation. Her dedication to improving facility inspection processes demonstrates the impact of her work on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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