Anjo, Japan

Miwazi Ikeya

This inventor holds 1 USPTO granted patent. Top assignee: Nippondenso Co., Ltd.. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miwazi Ikeya. Retrieved from https://idiyas.com/inventor/miwazi-ikeya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Miwazi Ikeya: Innovator in Optical Data Reader Technology

Introduction

Miwazi Ikeya is a notable inventor based in Anjo, Japan. He has made significant contributions to the field of optical data reading technology. His innovative approach has led to the development of a unique patent that enhances the functionality of optical data readers.

Latest Patents

Miwazi Ikeya holds a patent for a "Housing for an optical data reader." This invention is designed to improve the efficiency and effectiveness of optical data reading devices. His work in this area showcases his commitment to advancing technology in practical applications.

Career Highlights

Ikeya is currently employed at Nippondenso Co., Ltd., a company known for its dedication to innovation and quality in technology. His role at the company allows him to collaborate with other talented professionals in the field.

Collaborations

Some of his coworkers include Kazuhiko Hagiwara and Yosimutu Sibata. Their collective expertise contributes to the innovative environment at Nippondenso Co., Ltd.

Conclusion

Miwazi Ikeya's contributions to optical data reader technology exemplify his dedication to innovation. His patent and work at Nippondenso Co., Ltd. highlight his role as a key player in advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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