Itami, Japan

Mitsuya Hashii

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsuya Hashii. Retrieved from https://idiyas.com/inventor/mitsuya-hashii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Mitsuya Hashii: Semiconductor Bonding Innovation.

Introduction

Mitsuya Hashii is an inventor associated with Itami, Japan. His patent work addresses precision in mounting semiconductor devices by using laser bonding and lead-recognition controls.

Latest Patents

Hashii is credited with 1 patent: “Laser OLB Apparatus and Method of Mounting Semiconductor Device.” The invention describes an XY table, a bonding laser that joins substrate bonding lands to semiconductor-device leads, and a recognition device that checks whether the leads are free of flexure and deviation. A control unit permits bonding only after the recognition device confirms that the leads meet those conditions.

Career Highlights

Hashii is associated with Mitsubishi Electric Corporation, the English name commonly used for Mitsubishi Denki Kabushiki Kaisha. His patent reflects work on improving the accuracy and reliability of semiconductor-device assembly.

Collaborations

Haruo Shimamoto and Hideya Yagoura are identified as Hashii’s coworkers. Their shared professional context connects them to the semiconductor and electronics innovation environment surrounding his work.

Conclusion

Mitsuya Hashii’s patent presents a controlled laser-bonding approach that checks lead alignment before joining semiconductor components, highlighting his contribution to precision device assembly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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