Mitsutoshi Watabiki

Title: Innovations of Mitsutoshi Watabiki

Introduction

Mitsutoshi Watabiki is a notable inventor based in Yokkaichi, Japan. He has made significant contributions to the field of pattern inspection technology. His work focuses on enhancing the accuracy and efficiency of detecting defects in various substrates.

Latest Patents

Watabiki holds a patent for a "Pattern Inspection Apparatus and Pattern Inspection Method." This innovative method involves applying light from a source to a specific region of a substrate where an inspection target pattern is formed. The process includes guiding, imaging, and detecting reflected light from the substrate. It acquires detection signals across multiple wavelengths and generates added image data that includes information on wavelength and signal intensity. This data is crucial for determining whether the inspection target pattern has defects and for identifying the position of any defects.

Career Highlights

Mitsutoshi Watabiki is associated with Kabushiki Kaisha Toshiba, a leading company in technology and innovation. His work at Toshiba has allowed him to develop and refine his patented methods, contributing to advancements in the field of pattern inspection.

Collaborations

Watabiki collaborates with Makoto Kaneko, a fellow innovator. Their partnership enhances the research and development efforts within their projects.

Conclusion

Mitsutoshi Watabiki's contributions to pattern inspection technology exemplify the importance of innovation in improving defect detection methods. His work continues to influence the industry and drive advancements in technology.