Niigata, Japan

Mitsuru Otaki

This inventor holds 1 USPTO granted patent. Top assignee: Ishii Corporation Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsuru Otaki. Retrieved from https://idiyas.com/inventor/mitsuru-otaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Mitsuru Otaki: Innovator in Taper Reamer Technology

Introduction

Mitsuru Otaki is a notable inventor based in Niigata, Japan. He has made significant contributions to the field of machining with his innovative designs. His work focuses on improving the accuracy and longevity of machining tools.

Latest Patents

Mitsuru Otaki holds a patent for a taper reamer. This invention enhances machining accuracy and extends the machining life of the tool. The taper reamer features multiple cutting edges with a helical shape on the outer periphery. Each cutting edge has a unique intertooth angle, which varies at a given reference position. Additionally, the helix angles of the cutting edges differ from one another, preventing resonance during cutting.

Career Highlights

Otaki is associated with Ishii Corporation Co., Ltd., where he applies his expertise in machining technology. His innovative approach has led to advancements in the design and functionality of cutting tools.

Collaborations

Mitsuru Otaki has worked alongside talented colleagues, including Yuki Ogiue and Hiroshi Saito. Their collaborative efforts contribute to the ongoing development of innovative machining solutions.

Conclusion

Mitsuru Otaki's contributions to taper reamer technology exemplify his commitment to enhancing machining processes. His innovative designs continue to influence the industry and improve tool performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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