Zama, Japan

Mitsuru Oda

This inventor holds 2 USPTO granted patents. Top assignee: Akashi Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsuru Oda. Retrieved from https://idiyas.com/inventor/mitsuru-oda-idrkrcft

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2002

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2 patents (USPTO):Explore Patents

Title: Mitsuru Oda: Innovator in Impression Forming Mechanisms

Introduction

Mitsuru Oda is a notable inventor based in Zama, Japan. He has made significant contributions to the field of impression forming mechanisms and hardness testing apparatuses. With a total of 2 patents, Oda's work reflects his dedication to innovation and technology.

Latest Patents

Oda's latest patents include an impression forming mechanism and a hardness testing apparatus. The impression forming mechanism comprises an arm with an indentor designed to create an impression on the surface of a sample. Additionally, it features an arm operating part that allows for the application of force to the sample, with the arm operating part positioned below the arm. This innovative design enhances the efficiency and accuracy of the impression forming process.

Career Highlights

Mitsuru Oda is currently employed at Akashi Corporation, where he continues to develop and refine his inventions. His work at the company has positioned him as a key player in the advancement of testing technologies.

Collaborations

Oda collaborates with talented individuals such as Masaru Kawazoe and Yuichi Minami. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Mitsuru Oda's contributions to the field of impression forming mechanisms and hardness testing apparatuses highlight his role as a significant inventor. His patents and collaborations reflect a commitment to advancing technology in his industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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